[01] A. V. Polyakov, Department of Radio Physics and Computer Technology, Belarussian State University, Minsk, Belarus.

The method of theoretical estimation of the optoelectronic measurement systems systematic error, arising due to temperature changes is proposed. Mathematical models of the temperature dependence of the Ge - and InGaAs-photodiodes spectral responsivity, correction factor and noise equivalent power for optical time domain reflectometer was developed. It showed significantly better correlation of the results with experimental data in comparison with the triangular and Gaussian approximation. The developed model permits further improvement of accuracy in fiber-optic measurements based on Ge - and InGaAs - photodiodes, especially in the near-infrared wavelength region.

Optical Measurement, Semiconductor Photodetector, Spectral Responsivity, Temperature Error

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